Miscut measuring of SrTiO3 single crystal using high resolution X-ray diffraction

Authors

  • Aziz M. Abdullah Department of Science, College of Basic Education, University of Charmo, Chamchamal, Kurdistan Region, Iraq. Author
  • Salah R. Saeed Department of Science, College of Basic Education, University of Charmo, Chamchamal, Kurdistan Region, Iraq. Author

DOI:

https://doi.org/10.17656/jzs.10398

Keywords:

Strontium titanate (SrTiO3) High resolution X-ray diffraction Substrate Thin films Miscut

Abstract

Strontium titanate (SrTiO3) is one of the perovskite type metal oxides with multifunctional properties and it has a lot of applications in various sectors of technology. In
this paper, we obtained the miscut angles from Bragg peak after performing ω scans of
HRXRD at different angles of φ with intervals of 90○. The obtained results located
between 0.2015○ and 0.4302○ using two ways (mathematically and Epitaxy software),
which is considered as a tolerance limit (less than 1°) to cut the substrates.

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Published

2015-04-19

How to Cite

Miscut measuring of SrTiO3 single crystal using high resolution X-ray diffraction. (2015). Journal of Zankoy Sulaimani - Part A, 17(3), 33-40. https://doi.org/10.17656/jzs.10398